Having a clear
picture of how your materials are interacting is
the first step in making any improvements; you need good data to
make good informed decisions with. No
matter if you’re working yield enhancement, new
product development or investigating the root cause of a failed device, our materials analysis
experts can help.
We offer both nondestructive and destructive evaluation depending on
CSAM – Gen 6 Sonoscan
Optical Inspection – Leica Imaging & Measurement
2D & 3D X-Ray Capability
Potting, Cross Sections, and Layer Measurement
Download our 3D-XRay Case Study!
CLICK HERE to download our 3D X-ray “wire sweep” case study. View the
file and see for yourself the level of detail this tool is capable of.
ABOUT THE FILE: The case study will be downloaded in .zip format and will include a .pdf and .mp4 file. The .mp4 file is an example of the animation that can be produced by
the X-ray's software. These animations allow us to view device features in greater detail as the IC rotates.